Abstract Details
| Name: Sireesha Chamarthi Affiliation: IIA, Bengaluru Conference ID: ASI2019_163 Title : Sensitivity analysis on VBT Echelle spectrogtaph for precision Radial velocity measurements Authors and Co-Authors : Sireesha Chamarthi, Ravinder Kumar Banyal, S.Sriram Abstract Type : Poster Abstract Category : Instrumentation and Techniques Abstract : High-resolution Echelle spectrograph at VBT, Kavalur, India is a general purpose instrument with a compact design and movable grating to accommodate for the wavelength gaps. The instrument is utilized for various spectroscopic observations, thus movement of the grating is inevitable. With these design considerations, the zero-point of the optomechanical components (required for high precision Radial velocity measurements) is not fixed. Hence it is essential to analyze the sensitivity of individual optical components to estimate the stability tolerance from the spectrograph. From the analysis, in order to utilize the spectrograph for precision RV studies, the optomechanical locking requirement is evaluated. In this work, the stability analysis and the estimate of achievable precision in RV measurements with the spectrograph are reported. |