Abstract Details
| Name: Biswajit Mondal Affiliation: PRL, Ahmedabad Conference ID: ASI2019_412 Title : Optimization and reflectivity data fitting for x-ray multilayer mirrors. Authors and Co-Authors : Biswajit Mondal, Prof.Santosh V Vadawale Abstract Type : Poster Abstract Category : Instrumentation and Techniques Abstract : Multi-layer coatings contains alternate layers of high Z and low Z materials with typical thickness of XXX nm/Å. Coatings with equal spacing are effective for discrete energies but the thickness of the layers can be varied over different layers to obtain broader energy range. Design of such dept require optimization of coating materials, number of layers, their thicknesses, roughness etc. IMD is a standard software used for such optimization, however, being an IDL based GUI software, it has some limitations in terms of iterative scripting capabilities or complex fitting. Finally say that in this context we have developed alternate implementation of the Fresnel formalism to calculate reflectivity of multi-layer coatings which can be used with the standard spectral fitting software such as ISIS or XSPEC. Details of this implementation along with its comparison with IMD as well as experimental data will be presented. |